专利内容由知识产权出版社提供
专利名称：THERMAL INSULATION PERFORMANCE
MEASUREMENT APPARATUS AND
MEASUREMENT METHOD USING THE SAME
发明人：Jae Sung Kwon,Hyung Sung Kim,Jong Sung
Park,Young Sung Jung
申请号：US13747625申请日：20130123
公开号：US20130193820A1公开日：20130801
专利附图：
摘要：A thermal insulation performance measurement apparatus which measures
thermal insulation performance of a thermal insulator by heat flux to the thermalinsulator, measured by a heat flux sensor, and a measurement method using the sameincludes a heat flux sensor provided with one surface adapted to contact an object to bemeasured, a first heat source arranged on the upper surface of the heat flux sensor tosupply heat to the heat flux sensor, a thermal insulator arranged on the upper surface ofthe first heat source, a third heat source arranged on the upper surface of the thermalinsulator, and a second heat source arranged around the heat flux sensor.
申请人：Samsung Electronics Co., Ltd.
地址：Suwon-si KR
国籍：KR
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