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Methods of forming transistors

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专利名称:Methods of forming transistors发明人:David H. Wells申请号:US11704466申请日:20070207公开号:US079322B2公开日:20110802

专利附图:

摘要:Some embodiments include methods of forming voids within semiconductorconstructions. In some embodiments the voids may be utilized as microstructures fordistributing coolant, for guiding electromagnetic radiation, or for separation and/orcharacterization of materials. Some embodiments include constructions having micro-

structures therein which correspond to voids, conduits, insulative structures,semiconductor structures or conductive structures.

申请人:David H. Wells

地址:Boise ID US

国籍:US

代理机构:Wells St. John P.S.

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