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专利名称：Method and arrangement for the analysis of
the response of optically excitedsemiconductor materials
发明人：GEILER, HANS-DIETER,WAGNER, MATTHIAS申请号：EP96103947.6申请日：19960313公开号：EP0735378A2公开日：19961002
专利附图：
摘要：The method involves stimulating electronic energy deposition in an object (4) inthe form of stimulated charge carriers using a laser (1) beam; the relaxation of the
stimulated charge carriers is measured (5) as luminescent radiation emanating from theobject. The stimulating laser beam is intensity modulated, whereby the frequencyspectrum has two discrete modulation frequencies (Omega1, Omega2). The luminescentlight emanating from the object is measured to determine the difference between themodulation frequencies. The luminescent light is analysed as a function of the arithmeticmean of the modulation frequencies.
申请人：JENOPTIK AKTIENGESELLSCHAFT
地址：Carl-Zeiss-Strasse 1 D-07743 Jena DE
国籍：DE
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