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专利名称：Testing digital integrated circuits发明人：Hale, Stuart George,Naven, Finbar申请号：EP86300586.4申请日：19860129公开号：EP0196152A2公开日：19861001
摘要：A digital integrated circuit includes a register (10) having a normal mode ofoperation in which it acts as a parallel input/ output register. The register also has asecond mode of operation in which it acts as a pseudo-random number generator, and athird mode in which it is connected as a circular shift register. This allows the registertobe used forproducing a variety of different test sequences for testing other parts of thecircuits e.g. fortesting a programmable logic array included in the circuit.
申请人：INTERNATIONAL COMPUTERS LIMITED
地址：ICL House Putney, London, SW15 1SW GB
国籍：GB
代理机构：Guyatt, Derek Charles
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